Random Fault Verification Supported by New Safety Critical Apps, Certification Kits
OneSpin® Solutions, provider of innovative formal verification solutions for highly reliable, digital integrated circuits (ICs), today unveiled its comprehensive safety critical analysis and diagnostic coverage solution for automotive and other mission-critical applications.
“While formal verification is invaluable for any hardware application, its ability to debug automotive and mission-critical applications may prove to be the most effective use of this technology,” says Dr. Raik Brinkmann, OneSpin’s chief executive officer. “OneSpin’s formal verification solutions ensure that suppliers of mission-critical applications, including multiple automotive semiconductor leaders, continue to meet rigorous international safety critical standards while advancing their technology.”
Two types of fault verification processes — systematic and random — are required for devices that adhere to the automotive ISO 26262 standard. OneSpin’s complete formal solution for systematic verification is used in a variety of automotive production environments worldwide. Its proven methodology for capturing specification elements in verification tests, and then accurately measuring and feeding back coverage to systematically close the verification process is a well-established, de facto methodology in multiple automotive companies.