Product Datasheet - Sequence Design - CoolTime
CoolTime™ - Accelerate Low Power Design Closure
Electrical Integrity Analysis for Nanometer SoC Design
CoolTime™ is the industry's leading cell-based electrical integrity solution for concurrent analysis of voltage drop, power, electromigration (EM), timing and signal integrity (SI) for nanometer SoC designs. Eliminating the need for multiple point tools and iterations, CoolTime renders accurate and convergent analysis of inter-dependent electrical effects. CoolTime shares a common platform with CoolPower™ optimisation to ensure rapid design closure for dynamic voltage drop, leakage power, EM, timing and SI effects.
CoolTime Highlights
- Highest accuracy, capacity and performance SoC tool for dynamic voltage drop analysis
- Comprehensive RLC model including decaps and package
- Simulation-based and vectorless modes for realistic stimulus
- High-speed embedded extractor using silicon-proven ColumbusTM technology
- Cell characterisation for transient current waveforms, Accuwave™
- Accurate memory and macro current modelling
- Event-based timing and SI analysis for crosstalk and voltage drop effects
- Hierarchical analysis providing SoC capacity
- Cell characterisation for voltage-aware timing and SI modelling
- 5-10x faster than existing STA tools
- Virtual rail voltage and recovery time analysis for MTCMOS power gated designs
- Easy-to-use graphical interface and detailed reports
- Shared analysis platform with CoolPower™ optimisation
- Correlated with silicon and industry standard circuit simulators
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CoolTime Datasheet 
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